The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	2015-2018
Number of pages	4
Journal	Journal of Non-Crystalline Solids
Volume	358
Issue number	17
DOIs	https://doi.org/10.1016/j.jnoncrysol.2012.01.037
Publication status	Published - 2012

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@article{a068a04c56b44c7c8668d68ed961441b,

title = "The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies",

author = "J Melskens and AHM Smets and SWH Eijt and H Schut and EH Br{\"u}ck and M Zeman",

year = "2012",

doi = "10.1016/j.jnoncrysol.2012.01.037",

language = "English",

volume = "358",

pages = "2015--2018",

journal = "Journal of Non-Crystalline Solids",

issn = "0022-3093",

publisher = "Elsevier",

number = "17",

}

TY - JOUR

T1 - The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies

AU - Melskens, J

AU - Smets, AHM

AU - Eijt, SWH

AU - Schut, H

AU - Brück, EH

AU - Zeman, M

PY - 2012

Y1 - 2012

U2 - 10.1016/j.jnoncrysol.2012.01.037

DO - 10.1016/j.jnoncrysol.2012.01.037

M3 - Article

VL - 358

SP - 2015

EP - 2018

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

SN - 0022-3093

IS - 17

ER -