The negative effect of high-temperature annealing on charge-carrier lifetimes in microcrystalline PCBM

JM Warman, MP de Haas, ThD Anthopoulos, DM de Leeuw

Research output: Contribution to journalArticleScientificpeer-review

39 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2294-2298
Number of pages5
JournalAdvanced Materials
Volume18
Publication statusPublished - 2006

Keywords

  • CWTS JFIS >= 2.00

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