The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS

Z Remes; RA Vasudevan; K Jarolimek; AHM Smets; M Zeman

doi:10.4028/www.scientific.net/SSP.213.19

The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS

Z Remes, RA Vasudevan, K Jarolimek, AHM Smets, M Zeman

Photovoltaic Materials and Devices

Research output: Contribution to journal › Article › Scientific › peer-review

16 Citations (Scopus)

Original language	English
Pages (from-to)	19-28
Number of pages	10
Journal	Solid State Phenomena
Volume	213
DOIs	https://doi.org/10.4028/www.scientific.net/SSP.213.19
Publication status	Published - 2014

Bibliographical note

Harvest
Available online 24-3-2014

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

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10.4028/www.scientific.net/SSP.213.19

Cite this

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title = "The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS",

author = "Z Remes and RA Vasudevan and K Jarolimek and AHM Smets and M Zeman",

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T1 - The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS

AU - Remes, Z

AU - Vasudevan, RA

AU - Jarolimek, K

AU - Smets, AHM

AU - Zeman, M

N1 - Harvest Available online 24-3-2014

PY - 2014

Y1 - 2014

UR - https://www.scopus.com/pages/publications/84898899036

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DO - 10.4028/www.scientific.net/SSP.213.19

M3 - Article

SN - 1012-0394

VL - 213

SP - 19

EP - 28

JO - Solid State Phenomena

JF - Solid State Phenomena

ER -

The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS

Bibliographical note

UN SDGs

Access to Document

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Cite this