The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references

LA Machado da Rocha; E Cretu; RF Wolffenbuttel

The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references

LA Machado da Rocha, E Cretu, RF Wolffenbuttel

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

7 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	IMtc®/2002 Proceedings of the 19th IEEE Instrumentation and measurement technology conference
Place of Publication	s.l.
Publisher	IEEE
Pages	759-764
Number of pages	6
ISBN (Print)	0-7803-7218-2
Publication status	Published - 2002
Event	19th IEEE Instrumentation and measurement technology conference, Anchorage, Alaska, USA - s.l. Duration: 21 May 2002 → 23 May 2002

Publication series

Name
Publisher	IEEE

Name
Volume	1

Conference

Conference	19th IEEE Instrumentation and measurement technology conference, Anchorage, Alaska, USA
Period	21/05/02 → 23/05/02

Keywords

ZX Nader te bep. ivm conversie
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{c962fe49448d42058137e23edd53a33a,

title = "The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references",

keywords = "ZX Nader te bep. ivm conversie, ZX Int.klas.verslagjaar < 2002",

author = "{Machado da Rocha}, LA and E Cretu and RF Wolffenbuttel",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7218-2",

publisher = "IEEE",

pages = "759--764",

booktitle = "IMtc{\textregistered}/2002 Proceedings of the 19th IEEE Instrumentation and measurement technology conference",

address = "United States",

note = "19th IEEE Instrumentation and measurement technology conference, Anchorage, Alaska, USA ; Conference date: 21-05-2002 Through 23-05-2002",

}

Machado da Rocha, LA, Cretu, E & Wolffenbuttel, RF 2002, The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references. in IMtc®/2002 Proceedings of the 19th IEEE Instrumentation and measurement technology conference. IEEE, s.l., pp. 759-764, 19th IEEE Instrumentation and measurement technology conference, Anchorage, Alaska, USA, 21/05/02.

The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references. / Machado da Rocha, LA; Cretu, E; Wolffenbuttel, RF.
IMtc®/2002 Proceedings of the 19th IEEE Instrumentation and measurement technology conference. s.l.: IEEE, 2002. p. 759-764.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references

AU - Machado da Rocha, LA

AU - Cretu, E

AU - Wolffenbuttel, RF

PY - 2002

Y1 - 2002

KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7218-2

SP - 759

EP - 764

BT - IMtc®/2002 Proceedings of the 19th IEEE Instrumentation and measurement technology conference

PB - IEEE

CY - s.l.

T2 - 19th IEEE Instrumentation and measurement technology conference, Anchorage, Alaska, USA

Y2 - 21 May 2002 through 23 May 2002

ER -