Abstract
YBa2Cu3O7-δ films on SrTiO3 are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APB-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.
Original language | English |
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Pages (from-to) | 27-30 |
Number of pages | 4 |
Journal | Journal of Alloys and Compounds |
Volume | 251 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1997 |
Externally published | Yes |
Keywords
- Defect structure
- Growth conditions
- Surface roughness
- YBaCuO Films