The relation between the defect structure, the surface roughness and the growth conditions of YBa2Cu3O7-δ films

B. Dam*, C. Træholt, B. Stäuble-Pümpin, J. Rector, D. G. De Groot

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Abstract

YBa2Cu3O7-δ films on SrTiO3 are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APB-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.

Original languageEnglish
Pages (from-to)27-30
Number of pages4
JournalJournal of Alloys and Compounds
Volume251
Issue number1-2
DOIs
Publication statusPublished - Apr 1997

Keywords

  • Defect structure
  • Growth conditions
  • Surface roughness
  • YBaCuO Films

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