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The safe operating volume as a general measure for the operating limits of LDMOS transistors
Alessandro Ferrara, Peter Steeneken, Anco Heringa, Boni K. Boksteen, M Swanenberg, AJ Scholten, L van Dijk, Jurriaan Schmitz, Raymond J.E. Hueting
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
1
Citation
(Scopus)