The Small Signal Amplification of the Gated Diode Operated in Breakdown Regime

Al. Rusu; D Dobrescu; M Enachescu; C Burileanu; Ad. Rusu

The Small Signal Amplification of the Gated Diode Operated in Breakdown Regime

Al. Rusu, D Dobrescu, M Enachescu, C Burileanu, Ad. Rusu

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings of 34th International Semiconductor Conference (CAS 2011)
Editors	D Dascalu, A Rusu
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	321-324
Number of pages	4
ISBN (Print)	978-1-61284-171-7
Publication status	Published - 2011
Event	CAS 2011 - Piscataway, NJ, USA Duration: 17 Oct 2011 → 19 Oct 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	CAS 2011
Period	17/10/11 → 19/10/11

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Cite this

@inproceedings{6b14df203a9247bfb413359ecc1ea97a,

title = "The Small Signal Amplification of the Gated Diode Operated in Breakdown Regime",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "Al. Rusu and D Dobrescu and M Enachescu and C Burileanu and Ad. Rusu",

year = "2011",

language = "English",

isbn = "978-1-61284-171-7",

publisher = "IEEE Society",

pages = "321--324",

editor = "D Dascalu and A Rusu",

booktitle = "Proceedings of 34th International Semiconductor Conference (CAS 2011)",

note = "CAS 2011 ; Conference date: 17-10-2011 Through 19-10-2011",

}

The Small Signal Amplification of the Gated Diode Operated in Breakdown Regime. / Rusu, Al.; Dobrescu, D; Enachescu, M et al.
Proceedings of 34th International Semiconductor Conference (CAS 2011). ed. / D Dascalu; A Rusu. Piscataway, NJ, USA: IEEE Society, 2011. p. 321-324.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - The Small Signal Amplification of the Gated Diode Operated in Breakdown Regime

AU - Rusu, Al.

AU - Dobrescu, D

AU - Enachescu, M

AU - Burileanu, C

AU - Rusu, Ad.

PY - 2011

Y1 - 2011

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-61284-171-7

SP - 321

EP - 324

BT - Proceedings of 34th International Semiconductor Conference (CAS 2011)

A2 - Dascalu, D

A2 - Rusu, A

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - CAS 2011

Y2 - 17 October 2011 through 19 October 2011

ER -