The state-of-art future trends in testing embedded memories

S Hamdioui, GN Gaydadjiev, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

51 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationRecords of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004
EditorsFM Titsworth
Place of PublicationPiscataway
PublisherIEEE
Pages54-59
Number of pages6
ISBN (Print)0-7695-2193-2
Publication statusPublished - 2004
Event2004 International workshop on Memory Technology, Design and Technology, San Jose, USA - Piscataway
Duration: 9 Aug 200410 Aug 2004

Publication series

Name
PublisherIEEE Computer Society

Conference

Conference2004 International workshop on Memory Technology, Design and Technology, San Jose, USA
Period9/08/0410/08/04

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag

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