The use of a central beam stop for contrast enhancement in TEM imaging

C Zhang, Q Xu, JPJ Peters, HW Zandbergen

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    2 Citations (Scopus)

    Abstract

    Dark field TEM imaging using a stop of the central beam (DF-000) is reported, It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1 angstrom(-1) was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase pla
    Original languageEnglish
    Pages (from-to)200-206
    Number of pages7
    JournalUltramicroscopy
    Volume134
    Issue numberSI
    Publication statusPublished - 2013

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  • Cite this

    Zhang, C., Xu, Q., Peters, JPJ., & Zandbergen, HW. (2013). The use of a central beam stop for contrast enhancement in TEM imaging. Ultramicroscopy, 134(SI), 200-206.