The use of dissimilarities for object recognition

EM Pekalska; RPW Duin

The use of dissimilarities for object recognition

EM Pekalska, RPW Duin

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of the EOS Conference on Industrial Image and Machine Vision
Editors	s.n.
Place of Publication	Bellingham (WA), USA
Publisher	SPIE
Pages	50-53
Number of pages	4
ISBN (Print)	3-00-0163161-1
Publication status	Published - 2005
Event	EOS Conference on Industrial Image and Machine Vision; Munich, Germany - Bellingham (WA), USA Duration: 13 Jun 2005 → 15 Jun 2005

Publication series

Name
Publisher	SPIE

Conference

Conference	EOS Conference on Industrial Image and Machine Vision; Munich, Germany
Period	13/06/05 → 15/06/05

Bibliographical note

Editor onbekend, WPM

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{2d8786f7b5d64011898d10211c1feb65,

title = "The use of dissimilarities for object recognition",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "EM Pekalska and RPW Duin",

note = "Editor onbekend, WPM; EOS Conference on Industrial Image and Machine Vision; Munich, Germany ; Conference date: 13-06-2005 Through 15-06-2005",

year = "2005",

language = "Undefined/Unknown",

isbn = "3-00-0163161-1",

publisher = "SPIE",

pages = "50--53",

editor = "s.n.",

booktitle = "Proceedings of the EOS Conference on Industrial Image and Machine Vision",

address = "United States",

}

TY - GEN

T1 - The use of dissimilarities for object recognition

AU - Pekalska, EM

AU - Duin, RPW

N1 - Editor onbekend, WPM

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 3-00-0163161-1

SP - 50

EP - 53

BT - Proceedings of the EOS Conference on Industrial Image and Machine Vision

A2 - s.n., null

PB - SPIE

CY - Bellingham (WA), USA

T2 - EOS Conference on Industrial Image and Machine Vision; Munich, Germany

Y2 - 13 June 2005 through 15 June 2005

ER -