The use of Electronic Spechte Pattern Interferometry (ESPI).

H Botter, ? Wijen, A van den Berg, F Soetens, IJJ van Straalen, A Vlot

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Structural Adhesives in Engineering, Sixth International Conference.
Place of Publication	Londen UK
Publisher	The Institute of Materials
Pages	1-5
Number of pages	5
Publication status	Published - 2001
Event	Structural Adhesives in Engineering VI, Bristol, UK - Londen UK Duration: 4 Jul 2001 → …

Name
Publisher	The Institute of Materials

Conference	Structural Adhesives in Engineering VI, Bristol, UK
Period	4/07/01 → …

Keywords

@inproceedings{6802a6bd6fa34a708d7a04c8cbad16a1,

title = "The use of Electronic Spechte Pattern Interferometry (ESPI).",

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author = "H Botter and ? Wijen and {van den Berg}, A and F Soetens and {van Straalen}, IJJ and A Vlot",

year = "2001",

language = "Undefined/Unknown",

publisher = "The Institute of Materials",

pages = "1--5",

booktitle = "Structural Adhesives in Engineering, Sixth International Conference.",

note = "null ; Conference date: 04-07-2001",

}

The use of Electronic Spechte Pattern Interferometry (ESPI). / Botter, H; Wijen, ?; van den Berg, A; Soetens, F; van Straalen, IJJ; Vlot, A.

Structural Adhesives in Engineering, Sixth International Conference.. Londen UK : The Institute of Materials, 2001. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - The use of Electronic Spechte Pattern Interferometry (ESPI).

AU - Botter, H

AU - Wijen, ?

AU - van den Berg, A

AU - Soetens, F

AU - van Straalen, IJJ

AU - Vlot, A

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SP - 1

EP - 5

BT - Structural Adhesives in Engineering, Sixth International Conference.

PB - The Institute of Materials

CY - Londen UK

Y2 - 4 July 2001

ER -