The use of neural network tools in statistical pattern recognition

RPW Duin, EEE Frietman, A Hoekstra, R Ligteringen, D de Ridder, M Skurichina, DMJ Tax, A Ypma

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Neural Networks: Best Practice in Europe
Editors	SGB Kappen
Place of Publication	Singapore
Publisher	World Scientific
Pages	165-168
Number of pages	4
ISBN (Print)	981-02-3338-8
Publication status	Published - 1997

Name
Publisher	World Scientific

Progress in Neural Processing

Cite this

@inproceedings{570695acdf9d48959546feb4d28a394a,

title = "The use of neural network tools in statistical pattern recognition",

author = "RPW Duin and EEE Frietman and A Hoekstra and R Ligteringen and {de Ridder}, D and M Skurichina and DMJ Tax and A Ypma",

note = "Progress in Neural Processing",

year = "1997",

language = "Undefined/Unknown",

isbn = "981-02-3338-8",

publisher = "World Scientific",

pages = "165--168",

editor = "SGB Kappen",

booktitle = "Neural Networks: Best Practice in Europe",

address = "Singapore",

}

TY - GEN

T1 - The use of neural network tools in statistical pattern recognition

AU - Duin, RPW

AU - Frietman, EEE

AU - Hoekstra, A

AU - Ligteringen, R

AU - de Ridder, D

AU - Skurichina, M

AU - Tax, DMJ

AU - Ypma, A

N1 - Progress in Neural Processing

PY - 1997

Y1 - 1997

M3 - Conference contribution

SN - 981-02-3338-8

SP - 165

EP - 168

BT - Neural Networks: Best Practice in Europe

A2 - Kappen, SGB

PB - World Scientific

CY - Singapore

ER -