Theoretical and practical validation of combined BEM/FEM substrate resistance modeling

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	ICCAD-2002: IEEE/ACM International conference on computer aided design
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	10-15
Number of pages	6
ISBN (Print)	0-7803-7607-2
Publication status	Published - 2002
Event	2002 International conference on computer-aided design - Piscataway, NJ, USA Duration: 10 Nov 2002 → 14 Nov 2002

Name
Publisher	IEEE

Conference	2002 International conference on computer-aided design
Period	10/11/02 → 14/11/02

Keywords

@inproceedings{04a061c516774d909a7bb9a3ba18b212,

title = "Theoretical and practical validation of combined BEM/FEM substrate resistance modeling",

keywords = "conference contrib. refereed, ZX Nader te bep. ivm conversie, ZX Int.klas.verslagjaar < 2002",

author = "E Schrik and PM Dewilde and {van der Meijs}, NP",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7607-2",

publisher = "IEEE Society",

pages = "10--15",

booktitle = "ICCAD-2002: IEEE/ACM International conference on computer aided design",

note = "2002 International conference on computer-aided design ; Conference date: 10-11-2002 Through 14-11-2002",

}

Theoretical and practical validation of combined BEM/FEM substrate resistance modeling. / Schrik, E ; Dewilde, PM ; van der Meijs, NP.
ICCAD-2002: IEEE/ACM International conference on computer aided design. Piscataway, NJ, USA: IEEE Society, 2002. p. 10-15.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Theoretical and practical validation of combined BEM/FEM substrate resistance modeling

AU - Schrik, E

AU - Dewilde, PM

AU - van der Meijs, NP

PY - 2002

Y1 - 2002

KW - conference contrib. refereed

KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7607-2

SP - 10

EP - 15

BT - ICCAD-2002: IEEE/ACM International conference on computer aided design

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 2002 International conference on computer-aided design

Y2 - 10 November 2002 through 14 November 2002

ER -