Thermal error reduction by topology optimisation

EC Hooijkamp, F van Keulen, J van Eijk

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the EUSPEN Special Interest Group - Thermal Issues
EditorsH Bosse, J van Eijk
Place of PublicationCranfield University, UK
PublisherEUSPEN
Pages53-59
Number of pages7
Publication statusPublished - 2014
EventEUSPEN Special Interest Group: Thermal Issues, Zürich, Switzerland - Cranfield University, UK
Duration: 19 Mar 201420 Mar 2014

Publication series

Name
PublisherEUSPEN

Conference

ConferenceEUSPEN Special Interest Group: Thermal Issues, Zürich, Switzerland
Period19/03/1420/03/14

Bibliographical note

NEO

Cite this