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Thermal impedance extraction and modeling for different silicon-on-glass BJT designs

A Rossi, V Moschiano, F Tamigi, N Nenadovic, LK Nanver, JW Slotboom

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationSAFE/ProRISC/SeSens Proceedings 2003
Editors s.n.
Place of PublicationUtrecht
PublisherThe Technology Foundation STW
Pages1-5
Number of pages5
ISBN (Print)90-73461-332
Publication statusPublished - 2003
EventProRISC Workshop 2003, Veldhoven - Utrecht
Duration: 26 Nov 200327 Nov 2003

Publication series

Name
PublisherThe Technology Foundation STW

Conference

ConferenceProRISC Workshop 2003, Veldhoven
Period26/11/0327/11/03

Bibliographical note

CD ROM

Keywords

  • Vakpubl., Overig wet. > 3 pag

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