Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes

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21 Citations (Scopus)

Original language	English
Pages (from-to)	1172-1174
Number of pages	3
Journal	IEEE Electron Device Letters
Volume	34
Issue number	9
DOIs	https://doi.org/10.1109/LED.2013.2274473
Publication status	Published - 2013

Harvest

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title = "Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes",

author = "H Ye and X Chen and {van Zeijl}, HW and AWJ Gielen and GQ Zhang",

note = "Harvest",

year = "2013",

doi = "10.1109/LED.2013.2274473",

language = "English",

volume = "34",

pages = "1172--1174",

journal = "IEEE Electron Device Letters",

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number = "9",

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T1 - Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes

AU - Ye, H

AU - Chen, X

AU - van Zeijl, HW

AU - Gielen, AWJ

AU - Zhang, GQ

N1 - Harvest

PY - 2013

Y1 - 2013

U2 - 10.1109/LED.2013.2274473

DO - 10.1109/LED.2013.2274473

M3 - Article

SN - 0741-3106

VL - 34

SP - 1172

EP - 1174

JO - IEEE Electron Device Letters

JF - IEEE Electron Device Letters

IS - 9

ER -