Thermal transient effect and improved junction temperature measurement method in high-voltage light-emitting diodes

H Ye, X Chen, HW van Zeijl, AWJ Gielen, GQ Zhang

Research output: Contribution to journalArticleScientificpeer-review

20 Citations (Scopus)
Original languageEnglish
Pages (from-to)1172-1174
Number of pages3
JournalIEEE Electron Device Letters
Volume34
Issue number9
DOIs
Publication statusPublished - 2013

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