Thickness determination of thin (similar to 20 nm) microcrystalline silicon layers

A Gordijn, J Loffler, WM Arnoldbik, FD Tichelaar, JK Rath, REI Schropp

    Research output: Contribution to journalArticleScientificpeer-review

    7 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)445-455
    Number of pages11
    JournalSolar Energy Materials & Solar Cells
    Volume87
    Issue number1-4
    Publication statusPublished - 2005

    Keywords

    • academic journal papers
    • ZX CWTS 1.00 <= JFIS < 3.00

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