Thickness measurement of CT- imaged objects

G de Vries; PW Verbeek; U Stelwagen

Thickness measurement of CT- imaged objects

G de Vries, PW Verbeek, U Stelwagen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging
Editors	JA Kaandorp, M Boasson, JFM Tonino, MG Vosselman
Place of Publication	Delft
Publisher	ASCI
Pages	179-183
Number of pages	5
ISBN (Print)	90-83086-4-1
Publication status	Published - 1999
Event	ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging - Delft Duration: 15 Jun 1999 → 17 Jun 1999

Publication series

Name
Publisher	ASCI

Conference

Conference	ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging
Period	15/06/99 → 17/06/99

Cite this

@inproceedings{1fe18b1d27a14e48b93813b26b290767,

title = "Thickness measurement of CT- imaged objects",

author = "{de Vries}, G and PW Verbeek and U Stelwagen",

year = "1999",

language = "Undefined/Unknown",

isbn = "90-83086-4-1",

publisher = "ASCI",

pages = "179--183",

editor = "JA Kaandorp and M Boasson and JFM Tonino and MG Vosselman",

booktitle = "ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging",

note = "ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging ; Conference date: 15-06-1999 Through 17-06-1999",

}

Thickness measurement of CT- imaged objects. / de Vries, G; Verbeek, PW; Stelwagen, U.
ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging. ed. / JA Kaandorp; M Boasson; JFM Tonino; MG Vosselman. Delft: ASCI, 1999. p. 179-183.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Thickness measurement of CT- imaged objects

AU - de Vries, G

AU - Verbeek, PW

AU - Stelwagen, U

PY - 1999

Y1 - 1999

M3 - Conference contribution

SN - 90-83086-4-1

SP - 179

EP - 183

BT - ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging

A2 - Kaandorp, JA

A2 - Boasson, M

A2 - Tonino, JFM

A2 - Vosselman, MG

PB - ASCI

CY - Delft

T2 - ASCI'99, Proc. 5th Annual Conference of the Advanced School for Computing and Imaging

Y2 - 15 June 1999 through 17 June 1999

ER -