Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

S. M. Shakeri; B Hulsken; L. J. Van Vliet; S. Stallinga

doi:10.1364/FIO.2014.FM4F.5

Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

S. M. Shakeri, B Hulsken, L. J. Van Vliet, S. Stallinga

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.

Original language	English
Title of host publication	Frontiers in Optics, FiO 2014
Publisher	Optical Society of America (OSA)
ISBN (Electronic)	1-55752-286-3
DOIs	https://doi.org/10.1364/FIO.2014.FM4F.5
Publication status	Published - 2014
Event	Frontiers in Optics 2014, Tuscon Arizona - Duration: 19 Oct 2014 → 23 Oct 2014

Conference

Conference	Frontiers in Optics 2014, Tuscon Arizona
Period	19/10/14 → 23/10/14

Access to Document

10.1364/FIO.2014.FM4F.5

Cite this

@inproceedings{199d6743fa6043d8ba0417468f69035c,

title = "Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology",

abstract = "We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.",

author = "Shakeri, {S. M.} and B Hulsken and {Van Vliet}, {L. J.} and S. Stallinga",

year = "2014",

doi = "10.1364/FIO.2014.FM4F.5",

language = "English",

booktitle = "Frontiers in Optics, FiO 2014",

publisher = "Optical Society of America (OSA)",

note = "Frontiers in Optics 2014, Tuscon Arizona ; Conference date: 19-10-2014 Through 23-10-2014",

}

TY - GEN

T1 - Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

AU - Shakeri, S. M.

AU - Hulsken, B

AU - Van Vliet, L. J.

AU - Stallinga, S.

PY - 2014

Y1 - 2014

N2 - We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.

AB - We measure the through-focus OTF of whole slide scanners for optical quality testing and monitoring. Analysis of the OTF data gives a system level evaluation of astigmatism, field curvature, chromatic aberrations, coma and spherical aberration.

UR - http://www.scopus.com/inward/record.url?scp=84919624605&partnerID=8YFLogxK

U2 - 10.1364/FIO.2014.FM4F.5

DO - 10.1364/FIO.2014.FM4F.5

M3 - Conference contribution

BT - Frontiers in Optics, FiO 2014

PB - Optical Society of America (OSA)

T2 - Frontiers in Optics 2014, Tuscon Arizona

Y2 - 19 October 2014 through 23 October 2014

ER -

Through-focus OTF based optical quality testing of whole-slide scanners for digital pathology

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this