@article{a53339e2b4a447439ed4642805031264,
title = "Through testing of any multiport memory with linear tests",
keywords = "Elektrotechniek, Techniek, ZX Nader te bep. ivm conversie",
author = "S Hamdioui and {van de Goor}, AJ",
year = "2002",
language = "Undefined/Unknown",
volume = "21",
pages = "217--232",
journal = "IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems",
issn = "0278-0070",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
number = "2",
}