Time based micro-g accelerometer with improved damper geometry

RA Dias; LA Rocha; L Mol; RF Wolffenbuttel; E Cretu

doi:10.1109.IMTC.2010.5488163

Time based micro-g accelerometer with improved damper geometry

RA Dias, LA Rocha, L Mol, RF Wolffenbuttel, E Cretu

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	International Instrumentation and Measurement Technology Conference
Editors	V Piuri
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	672-675
Number of pages	4
ISBN (Print)	978-1-4244-2832-8
DOIs	https://doi.org/10.1109.IMTC.2010.5488163
Publication status	Published - 2010
Event	Instrumentation and measurement technology conference I2MTC - Piscataway, NJ, USA Duration: 3 May 2010 → 6 May 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	Instrumentation and measurement technology conference I2MTC
Period	3/05/10 → 6/05/10

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109.IMTC.2010.5488163

Cite this

@inproceedings{debe616f99364da991d9a25bf3dcf4a1,

title = "Time based micro-g accelerometer with improved damper geometry",

keywords = "Conf.proc. > 3 pag",

author = "RA Dias and LA Rocha and L Mol and RF Wolffenbuttel and E Cretu",

year = "2010",

doi = "10.1109.IMTC.2010.5488163",

language = "English",

isbn = "978-1-4244-2832-8",

publisher = "IEEE",

pages = "672--675",

editor = "V Piuri",

booktitle = "International Instrumentation and Measurement Technology Conference",

address = "United States",

note = "Instrumentation and measurement technology conference I2MTC ; Conference date: 03-05-2010 Through 06-05-2010",

}

TY - GEN

T1 - Time based micro-g accelerometer with improved damper geometry

AU - Dias, RA

AU - Rocha, LA

AU - Mol, L

AU - Wolffenbuttel, RF

AU - Cretu, E

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

U2 - 10.1109.IMTC.2010.5488163

DO - 10.1109.IMTC.2010.5488163

M3 - Conference contribution

SN - 978-1-4244-2832-8

SP - 672

EP - 675

BT - International Instrumentation and Measurement Technology Conference

A2 - Piuri, V

PB - IEEE

CY - Piscataway, NJ, USA

T2 - Instrumentation and measurement technology conference I2MTC

Y2 - 3 May 2010 through 6 May 2010

ER -