Titanium nitride (TiN) as a gate material in BiCMOS devices for biomedical implants

NS Lawand, HW van Zeijl, PJ French, JJ Briaire, JHM Frijns

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings IEEE Sensors 2013
EditorsE Brown, Y Gianchandani, R Trew
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4673-4642-9
DOIs
Publication statusPublished - 2013
EventIEEE Sensors 2013 - Baltimore, MD, United States
Duration: 3 Nov 20136 Nov 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE Sensors 2013
CountryUnited States
CityBaltimore, MD
Period3/11/136/11/13

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