Topographical scanning and reproduction of near-planar surfaces of paintings

WS Elkhuizen, T Zaman, W Verhofstad, PP Jonker, J Dik, JMP Geraedts

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

13 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of SPIE-IS&T: Measuring, modeling, and reproducing material appearance
EditorsMV Ortiz Segovia, P Urban, JP Allebach
Place of PublicationBellingham, WA, USA
PublisherSPIE
Pages1-12
Number of pages12
ISBN (Print)9780819499356
DOIs
Publication statusPublished - 2014
EventMeasuring, modeling, and reproducing material appearance, San Francisco, USA - Bellingham, WA, USA
Duration: 3 Feb 20144 Feb 2014

Publication series

Name
PublisherSPIE-IS&T
Name
Volume9018

Conference

ConferenceMeasuring, modeling, and reproducing material appearance, San Francisco, USA
Period3/02/144/02/14

Keywords

  • Conf.proc. > 3 pag

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