Topographical scanning and reproduction of near-planar surfaces of paintings

WS Elkhuizen; T Zaman; W Verhofstad; PP Jonker; J Dik; JMP Geraedts

doi:doi:10.1117/12.2042492

Topographical scanning and reproduction of near-planar surfaces of paintings

WS Elkhuizen, T Zaman, W Verhofstad, PP Jonker, J Dik, JMP Geraedts

ChemE/Materials for Energy Conversion and Storage

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of SPIE-IS&T: Measuring, modeling, and reproducing material appearance
Editors	MV Ortiz Segovia, P Urban, JP Allebach
Place of Publication	Bellingham, WA, USA
Publisher	SPIE
Pages	1-12
Number of pages	12
ISBN (Print)	9780819499356
DOIs	https://doi.org/doi:10.1117/12.2042492
Publication status	Published - 2014
Event	Measuring, modeling, and reproducing material appearance, San Francisco, USA - Bellingham, WA, USA Duration: 3 Feb 2014 → 4 Feb 2014

Publication series

Name
Publisher	SPIE-IS&T

Name
Volume	9018

Conference

Conference	Measuring, modeling, and reproducing material appearance, San Francisco, USA
Period	3/02/14 → 4/02/14

Bibliographical note

Harvest

Keywords

Conf.proc. > 3 pag

Access to Document

doi:10.1117/12.2042492

Cite this

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title = "Topographical scanning and reproduction of near-planar surfaces of paintings",

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author = "WS Elkhuizen and T Zaman and W Verhofstad and PP Jonker and J Dik and JMP Geraedts",

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doi = "doi:10.1117/12.2042492",

language = "English",

isbn = "9780819499356",

publisher = "SPIE",

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editor = "{Ortiz Segovia}, MV and P Urban and JP Allebach",

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address = "United States",

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Elkhuizen, WS, Zaman, T, Verhofstad, W, Jonker, PP , Dik, J & Geraedts, JMP 2014, Topographical scanning and reproduction of near-planar surfaces of paintings. in MV Ortiz Segovia, P Urban & JP Allebach (eds), Proceedings of SPIE-IS&T: Measuring, modeling, and reproducing material appearance. SPIE, Bellingham, WA, USA, pp. 1-12, Measuring, modeling, and reproducing material appearance, San Francisco, USA, 3/02/14. https://doi.org/doi:10.1117/12.2042492

Topographical scanning and reproduction of near-planar surfaces of paintings. / Elkhuizen, WS; Zaman, T; Verhofstad, W et al.
Proceedings of SPIE-IS&T: Measuring, modeling, and reproducing material appearance. ed. / MV Ortiz Segovia; P Urban; JP Allebach. Bellingham, WA, USA: SPIE, 2014. p. 1-12.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Topographical scanning and reproduction of near-planar surfaces of paintings

AU - Elkhuizen, WS

AU - Zaman, T

AU - Verhofstad, W

AU - Jonker, PP

AU - Dik, J

AU - Geraedts, JMP

N1 - Harvest

PY - 2014

Y1 - 2014

KW - Conf.proc. > 3 pag

UR - http://resolver.tudelft.nl/uuid:5f23396a-bee3-4368-a3da-bdcedba1a5fe

U2 - doi:10.1117/12.2042492

DO - doi:10.1117/12.2042492

M3 - Conference contribution

SN - 9780819499356

SP - 1

EP - 12

BT - Proceedings of SPIE-IS&T: Measuring, modeling, and reproducing material appearance

A2 - Ortiz Segovia, MV

A2 - Urban, P

A2 - Allebach, JP

PB - SPIE

CY - Bellingham, WA, USA

T2 - Measuring, modeling, and reproducing material appearance, San Francisco, USA

Y2 - 3 February 2014 through 4 February 2014

ER -

Topographical scanning and reproduction of near-planar surfaces of paintings

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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Cite this