Total ionizing effects on 4-transistor CMOS image sensor pixels

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageEnglish
Title of host publicationProceedings of IEEE International conference on Electron Devices and Solid-State Circuits (EDSSC'10)
EditorsJB Xu, PKT Mok
Place of PublicationPiscataway, NJ, USA
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Print)978-1-4244-9998-4
Publication statusPublished - 2010
EventIEEE International conference on Electron Devices and Solid-State Circuits, EDSSC - Piscataway, NJ, USA
Duration: 15 Dec 201017 Dec 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE International conference on Electron Devices and Solid-State Circuits, EDSSC
Period15/12/1017/12/10

Keywords

  • conference contrib. non-refer.
  • Conf.proc. > 3 pag

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