Towards a catalog format for software metrics

Eric Bouwers, Arie Van Deursen, Joost Visser

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

8 Citations (Scopus)

Abstract

In the past two decades both the industry and the research community have proposed hundreds of metrics to track software projects, evaluate quality or estimate effort. Unfortunately, it is not always clear which metric works best in a particular context. Even worse, for some metrics there is little evidence whether the metric measures the attribute it was designed to measure. In this paper we propose a catalog format for software metrics as a first step towards a consolidated overview of available software metrics. This format is designed to provide an overview of the status of a metric in a glance, while providing enough information to make an informed decision about the use of the metric. We envision this format to be implemented in a (semantic) wiki to ensure that relationships between metrics can be followed with ease.

Original languageEnglish
Title of host publication5th International Workshop on Emerging Trends in Software Metrics, WETSoM 2014 - Proceedings
Place of PublicationNew York
PublisherAssociation for Computing Machinery (ACM)
Pages44-47
Number of pages4
ISBN (Electronic)9781450328548
DOIs
Publication statusPublished - 3 Jun 2014
Event5th International Workshop on Emerging Trends in Software Metrics, WETSoM 2014 - Hyderabad, India
Duration: 3 Jun 2014 → …

Conference

Conference5th International Workshop on Emerging Trends in Software Metrics, WETSoM 2014
Country/TerritoryIndia
CityHyderabad
Period3/06/14 → …

Keywords

  • Catalog Format
  • Information Overview
  • Software Metrics

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