Towards an effective utilization of partially defected interconnections in 2D mesh NoCs

C Chen; SD Cotofana

doi:10.1109/ISVLSI.2014.70

Towards an effective utilization of partially defected interconnections in 2D mesh NoCs

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	Proceedings - 2014 IEEE Computer Society Annual Symposium on VLSI
Editors	SP Mohanty, N Ranganathan, S Bhanja
Place of Publication	Los Alamitos, CA, USA
Publisher	IEEE
Pages	492-497
Number of pages	6
ISBN (Print)	978-1-4799-3763-9
DOIs	https://doi.org/10.1109/ISVLSI.2014.70
Publication status	Published - 2014
Event	ISVLSI 2014, Tampa, FL, USA - Los Alamitos, CA, USA Duration: 9 Jul 2014 → 11 Jul 2014

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	ISVLSI 2014, Tampa, FL, USA
Period	9/07/14 → 11/07/14

Bibliographical note

Harvest

Access to Document

10.1109/ISVLSI.2014.70

Cite this

@inproceedings{088275a5cf984b898b81a6f60bc9dc76,

title = "Towards an effective utilization of partially defected interconnections in 2D mesh NoCs",

author = "C Chen and SD Cotofana",

note = "Harvest; ISVLSI 2014, Tampa, FL, USA ; Conference date: 09-07-2014 Through 11-07-2014",

year = "2014",

doi = "10.1109/ISVLSI.2014.70",

language = "English",

isbn = "978-1-4799-3763-9",

publisher = "IEEE",

pages = "492--497",

editor = "SP Mohanty and N Ranganathan and S Bhanja",

booktitle = "Proceedings - 2014 IEEE Computer Society Annual Symposium on VLSI",

address = "United States",

}

Towards an effective utilization of partially defected interconnections in 2D mesh NoCs. / Chen, C; Cotofana, SD.
Proceedings - 2014 IEEE Computer Society Annual Symposium on VLSI. ed. / SP Mohanty; N Ranganathan; S Bhanja. Los Alamitos, CA, USA: IEEE, 2014. p. 492-497.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Towards an effective utilization of partially defected interconnections in 2D mesh NoCs

AU - Chen, C

AU - Cotofana, SD

N1 - Harvest

PY - 2014

Y1 - 2014

U2 - 10.1109/ISVLSI.2014.70

DO - 10.1109/ISVLSI.2014.70

M3 - Conference contribution

SN - 978-1-4799-3763-9

SP - 492

EP - 497

BT - Proceedings - 2014 IEEE Computer Society Annual Symposium on VLSI

A2 - Mohanty, SP

A2 - Ranganathan, N

A2 - Bhanja, S

PB - IEEE

CY - Los Alamitos, CA, USA

T2 - ISVLSI 2014, Tampa, FL, USA

Y2 - 9 July 2014 through 11 July 2014

ER -