Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

J Jansen; MT Otten; HW Zandbergen

doi:http://dx.doi.org10.1016/j.ultrami.2012.09.010

Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

J Jansen, MT Otten, HW Zandbergen

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.

Original language	Undefined/Unknown
Pages (from-to)	59-65
Number of pages	7
Journal	Ultramicroscopy
Volume	125
DOIs	https://doi.org/http://dx.doi.org10.1016/j.ultrami.2012.09.010
Publication status	Published - 2013

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http://dx.doi.org10.1016/j.ultrami.2012.09.010

Cite this

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title = "Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis",

abstract = "A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.",

author = "J Jansen and MT Otten and HW Zandbergen",

year = "2013",

doi = "http://dx.doi.org10.1016/j.ultrami.2012.09.010",

language = "Undefined/Unknown",

volume = "125",

pages = "59--65",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

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T1 - Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

AU - Jansen, J

AU - Otten, MT

AU - Zandbergen, HW

PY - 2013

Y1 - 2013

N2 - A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.

AB - A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.

U2 - http://dx.doi.org10.1016/j.ultrami.2012.09.010

DO - http://dx.doi.org10.1016/j.ultrami.2012.09.010

M3 - Article

SN - 0304-3991

VL - 125

SP - 59

EP - 65

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -