Towards automatic alignment of a crystalline sample in an electron microscope along a zone axis

J Jansen, MT Otten, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review


    A method is presented to use an electron microscope in transmission mode to determine the mis-tilt from a zone axis of a crystalline material. The method involves recording a number of additional diffractiion patterns with incident beams tilted over 2 to 3 degrees. It is shown that an accuracy of 0.02 degree can be achieved, which is far better than that of the specimen-stage tilt axes, which is about 0.1 degree for the beta-tilt.
    Original languageUndefined/Unknown
    Pages (from-to)59-65
    Number of pages7
    Publication statusPublished - 2013

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