Towards automatic control of scanning transmission electronmicroscopes

A Tejada Ruiz; SW van der Hoeven; AJ den Dekker; PMJ Van den Hof

Towards automatic control of scanning transmission electronmicroscopes

A Tejada Ruiz, SW van der Hoeven, AJ den Dekker, PMJ Van den Hof

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control
Editors	Fradkov,A
Place of Publication	St.Petersburg, Russia
Publisher	IEEE
Pages	788-793
Number of pages	6
ISBN (Print)	978-1-4244-4602-5
Publication status	Published - 2009
Event	18th international conference on control applications part of 2009 IEEE multiconference on systems and control - St.Petersburg, Russia Duration: 8 Jul 2009 → 10 Jul 2009

Publication series

Name
Publisher	IEEE

Conference

Conference	18th international conference on control applications part of 2009 IEEE multiconference on systems and control
Period	8/07/09 → 10/07/09

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{4cdea2d4e9a04ba6a58300b4e04f331f,

title = "Towards automatic control of scanning transmission electronmicroscopes",

keywords = "Conf.proc. > 3 pag",

author = "{Tejada Ruiz}, A and {van der Hoeven}, SW and {den Dekker}, AJ and {Van den Hof}, PMJ",

year = "2009",

language = "Undefined/Unknown",

isbn = "978-1-4244-4602-5",

publisher = "IEEE",

pages = "788--793",

editor = "Fradkov,A",

booktitle = "Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control",

address = "United States",

note = "18th international conference on control applications part of 2009 IEEE multiconference on systems and control ; Conference date: 08-07-2009 Through 10-07-2009",

}

Tejada Ruiz, A, van der Hoeven, SW, den Dekker, AJ & Van den Hof, PMJ 2009, Towards automatic control of scanning transmission electronmicroscopes. in Fradkov,A (ed.), Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control. IEEE, St.Petersburg, Russia, pp. 788-793, 18th international conference on control applications part of 2009 IEEE multiconference on systems and control, 8/07/09.

Towards automatic control of scanning transmission electronmicroscopes. / Tejada Ruiz, A; van der Hoeven, SW; den Dekker, AJ et al.
Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control. ed. / Fradkov,A. St.Petersburg, Russia: IEEE, 2009. p. 788-793.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Towards automatic control of scanning transmission electronmicroscopes

AU - Tejada Ruiz, A

AU - van der Hoeven, SW

AU - den Dekker, AJ

AU - Van den Hof, PMJ

PY - 2009

Y1 - 2009

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-4602-5

SP - 788

EP - 793

BT - Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control

A2 - Fradkov,A, null

PB - IEEE

CY - St.Petersburg, Russia

T2 - 18th international conference on control applications part of 2009 IEEE multiconference on systems and control

Y2 - 8 July 2009 through 10 July 2009

ER -