Towards automatic control of scanning transmission electronmicroscopes

A Tejada Ruiz, SW van der Hoeven, AJ den Dekker, PMJ Van den Hof

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control
Editors Fradkov,A
Place of PublicationSt.Petersburg, Russia
PublisherIEEE Society
Pages788-793
Number of pages6
ISBN (Print)978-1-4244-4602-5
Publication statusPublished - 2009
Event18th international conference on control applications part of 2009 IEEE multiconference on systems and control - St.Petersburg, Russia
Duration: 8 Jul 200910 Jul 2009

Publication series

Name
PublisherIEEE

Conference

Conference18th international conference on control applications part of 2009 IEEE multiconference on systems and control
Period8/07/0910/07/09

Keywords

  • Conf.proc. > 3 pag

Cite this

Tejada Ruiz, A., van der Hoeven, SW., den Dekker, AJ., & Van den Hof, PMJ. (2009). Towards automatic control of scanning transmission electronmicroscopes. In Fradkov,A (Ed.), Proceedings of the 18th international conference on control applications part of 2009 IEEE multiconference on systems and control (pp. 788-793). IEEE Society.