Towards contactless scanning thermal microscopy: measuring probe-sample separation

Roy Bijster, Hamed Sadeghian, Fred van Keulen

Research output: Contribution to conferenceAbstractScientific

Original languageEnglish
Number of pages2
Publication statusPublished - 2018
Event15th International Workshop on Nanomechanical Sensing - Incheon, Korea, Republic of
Duration: 26 Jun 201829 Jun 2018

Workshop

Workshop15th International Workshop on Nanomechanical Sensing
CountryKorea, Republic of
CityIncheon
Period26/06/1829/06/18

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