Towards contactless scanning thermal microscopy: measuring probe-sample separation

Roy Bijster, Hamed Sadeghian, Fred van Keulen

Research output: Contribution to conference › Abstract › Scientific

Original language	English
Number of pages	2
Publication status	Published - 2018
Event	15th International Workshop on Nanomechanical Sensing - Incheon, Korea, Republic of Duration: 26 Jun 2018 → 29 Jun 2018

Workshop	15th International Workshop on Nanomechanical Sensing
Country/Territory	Korea, Republic of
City	Incheon
Period	26/06/18 → 29/06/18

Cite this

@conference{a69f8552f6a84e1783c36c83895a7fbb,

title = "Towards contactless scanning thermal microscopy: measuring probe-sample separation",

author = "Roy Bijster and Hamed Sadeghian and {van Keulen}, Fred",

year = "2018",

language = "English",

note = "15th International Workshop on Nanomechanical Sensing ; Conference date: 26-06-2018 Through 29-06-2018",

}