Towards integrated design of a robust feedback controller and topography estimator for atomatic force microscopy

S Kuiper, PMJ Van den Hof, G Schitter

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationIFAC world congress
EditorsS Bittanti
Place of PublicationMilan, Italy
PublisherIFAC
Pages12709-12714
Number of pages6
Publication statusPublished - 2011
Event18th IFAC World Congress - Milaan, Italy
Duration: 28 Aug 20112 Sept 2011

Publication series

Name
PublisherIFAC

Conference

Conference18th IFAC World Congress
Period28/08/112/09/11

Keywords

  • Conf.proc. > 3 pag

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