@inproceedings{4a881001c78e4c4083dd7955b031b06b,
title = "Trade-off between the control bandwith and the measurement accuracy in atomic force microscopy",
keywords = "Conf.proc. > 3 pag",
author = "S Kuiper and G Schitter",
year = "2012",
language = "English",
isbn = "978-1-4577-1772",
publisher = "I2MTC2012",
pages = "888--893",
editor = "JC Miguez",
booktitle = "Instrumentation and Measurement Technology",
note = "Instrumentation and Measurement Technology, Montevideo, Uruguay ; Conference date: 13-05-2012 Through 16-05-2012",
}