Trade-off between the control bandwith and the measurement accuracy in atomic force microscopy

S Kuiper, G Schitter

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

1 Citation (Scopus)
Original languageEnglish
Title of host publicationInstrumentation and Measurement Technology
EditorsJC Miguez
Place of PublicationMontevideo, Uruguay
PublisherI2MTC2012
Pages888-893
Number of pages6
ISBN (Print)978-1-4577-1772
Publication statusPublished - 2012
EventInstrumentation and Measurement Technology, Montevideo, Uruguay - Montevideo, Uruguay
Duration: 13 May 201216 May 2012

Publication series

Name
PublisherI2MTC2012

Conference

ConferenceInstrumentation and Measurement Technology, Montevideo, Uruguay
Period13/05/1216/05/12

Keywords

  • Conf.proc. > 3 pag

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