Transfer system for insertion of specimens into electron microscopes under controlled atmospheres.

HW Zandbergen, PJ Kooyman, AD van Langeveld

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationElectron Microscopy 1996. Proceedings of the 14th International Congress on Electron Microscopy, Vol. II.
    EditorsHA Calderon Benavides, M Jose Yacaman
    Number of pages2
    Publication statusPublished - 1998

    Publication series

    NameMaterials Science
    ISSN (Print)1068-820X

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