Transition Edge Sensors for DC Operation and Low Magnetic Field Sensitivity

M. De Wit*, L. Gottardi, K. Nagayoshi, E. Taralli, D. Vaccaro, K. Ravensberg, M. P. Bruijn, J. Van Der Kuur, J. R. Gao, J. W.A. Den Herder

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The X-ray Integral Field Unit (X-IFU) is an imaging spectrometer based on a large array of Transition Edge Sensors (TES) measured using Time Domain Multiplexing (TDM). For the development of a backup detector array, we have designed and realized a cryogenic test setup capable of measuring 9 detectors in a single cooldown under DC bias. We have used this setup to study a small selection of low aspect ratio TES designs, intended to have a low normal resistance suitable for TDM readout. In this work we show how the different designs are affected by magnetic fields. We do this by presenting the impact on the transition shape, detector integrated Noise Equivalent Power (NEP), and sensitivity of the energy scale calibration. We find, in agreement with previous studies, that reducing the width of the TES bilayer greatly improves the detector resilience to magnetic fields, potentially by several orders of magnitude.

Original languageEnglish
Article number2100505
Number of pages5
JournalIEEE Transactions on Applied Superconductivity
Volume35
Issue number5
DOIs
Publication statusPublished - 2025

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • superconducting device noise
  • Superconducting photodetectors
  • X-ray detectors

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