Trends and challenges of SRAM reliability in the nano-scale era

MSK Seyab, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

25 Citations (Scopus)
Original languageEnglish
Title of host publication2010 intl. conf. on design & technology of integrated systems in nanoscale Era
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-1-4244-6340-4
Publication statusPublished - 2010
EventDTIS 2010 - Piscataway
Duration: 23 Mar 201025 Mar 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceDTIS 2010
Period23/03/1025/03/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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