Trends in tests and failure mechanisms in deep sub-micron technologies

S Hamdioui; Z Al-Ars; LL Mhamdi; GN Gaydadjiev; S Vassiliadis

Trends in tests and failure mechanisms in deep sub-micron technologies

S Hamdioui, Z Al-Ars, LL Mhamdi, GN Gaydadjiev, S Vassiliadis

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology
Editors	P Girard, M Masmoudi, J Mouine, M Renovell
Place of Publication	Piscataway
Publisher	IEEE
Pages	216-221
Number of pages	6
ISBN (Print)	0-7803-9726-6
Publication status	Published - 2006
Event	DTIS 2006 - Piscataway Duration: 5 Sept 2006 → 7 Sept 2006

Publication series

Name
Publisher	IEEE

Conference

Conference	DTIS 2006
Period	5/09/06 → 7/09/06

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

@inproceedings{26f529cba34b43a18ce141e7649669f7,

title = "Trends in tests and failure mechanisms in deep sub-micron technologies",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "S Hamdioui and Z Al-Ars and LL Mhamdi and GN Gaydadjiev and S Vassiliadis",

year = "2006",

language = "Undefined/Unknown",

isbn = "0-7803-9726-6",

publisher = "IEEE",

pages = "216--221",

editor = "P Girard and M Masmoudi and J Mouine and M Renovell",

booktitle = "2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology",

address = "United States",

note = "DTIS 2006 ; Conference date: 05-09-2006 Through 07-09-2006",

}

Trends in tests and failure mechanisms in deep sub-micron technologies. / Hamdioui, S ; Al-Ars, Z; Mhamdi, LL et al.
2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology. ed. / P Girard; M Masmoudi; J Mouine; M Renovell. Piscataway: IEEE, 2006. p. 216-221.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Trends in tests and failure mechanisms in deep sub-micron technologies

AU - Hamdioui, S

AU - Al-Ars, Z

AU - Mhamdi, LL

AU - Gaydadjiev, GN

AU - Vassiliadis, S

PY - 2006

Y1 - 2006

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-9726-6

SP - 216

EP - 221

BT - 2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology

A2 - Girard, P

A2 - Masmoudi, M

A2 - Mouine, J

A2 - Renovell, M

PB - IEEE

CY - Piscataway

T2 - DTIS 2006

Y2 - 5 September 2006 through 7 September 2006

ER -