Trends in tests and failure mechanisms in deep sub-micron technologies

S Hamdioui, Z Al-Ars, LL Mhamdi, GN Gaydadjiev, S Vassiliadis

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology
EditorsP Girard, M Masmoudi, J Mouine, M Renovell
Place of PublicationPiscataway
PublisherIEEE Society
Pages216-221
Number of pages6
ISBN (Print)0-7803-9726-6
Publication statusPublished - 2006
EventDTIS 2006 - Piscataway
Duration: 5 Sept 20067 Sept 2006

Publication series

Name
PublisherIEEE

Conference

ConferenceDTIS 2006
Period5/09/067/09/06

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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