Superconducting cavities with high quality factors play an essential role in circuit quantum electrodynamics and quantum computing. In measurements of the intrinsic loss rates of high frequency modes, it can be challenging to design an appropriate coupling to the measurement circuit in such a way that the resulting signal is sufficiently strong but also that this coupling does not lead to an unwanted loading circuit, obscuring the intrinsic internal loss rates. Here, we propose and demonstrate a spectroscopic probe of high-Q resonators based on the phenomena of electromagnetically induced transparency (EIT) between the resonator and qubit in the weak dispersive coupling regime. Applying a sideband drive signal to the qubit, we observe an interference dip originated from EIT in the qubit spectroscopy, originating from the quantum interference between the qubit probe signal and sideband transition. From the width and the depth of the dip, we are able to extract the single-photon linewidth of the resonator from an analytical model. Working in a previously unexplored regime in which the qubit has a larger linewidth than the resonator reduces the technical challenge of making a high-coherence qubit and is advantageous for remaining in the weakly invasive limit of coupling to the resonator. Furthermore, the sideband and the dispersive coupling between the resonator and the qubit can be tuned insitu controlling the strength of the sideband drive power. This in situ tuneability allows the technique to be applied for efficient measurement of the resonator loss rate for any quality factor below a fixed upper bound, on the order of 108 for our device, allowing a wide range of quality factors to be probed using a single design.