Two level on-line monitoring system to reduce GIS components failure

MAG Al-Suhaily, S Meijer, JJ Smit, P Sibbald, J Kanters

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	CMD 2010-International conference on condition monitoring and diagnosis
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	IEEE Society
Pages	850-853
Number of pages	4
Publication status	Published - 2010
Event	2010 Conference on Condition Monitoring and Diagnosis, Tokyo, Japan - Tokyo, Japan Duration: 6 Sep 2010 → 11 Sep 2010

Name
Publisher	IEEE

Conference	2010 Conference on Condition Monitoring and Diagnosis, Tokyo, Japan
Period	6/09/10 → 11/09/10

Keywords

@inproceedings{17f9218a39e4410da73a79a4d979bbc7,

title = "Two level on-line monitoring system to reduce GIS components failure",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "MAG Al-Suhaily and S Meijer and JJ Smit and P Sibbald and J Kanters",

year = "2010",

language = "English",

publisher = "IEEE Society",

pages = "850--853",

editor = "s.n.",

booktitle = "CMD 2010-International conference on condition monitoring and diagnosis",

note = "2010 Conference on Condition Monitoring and Diagnosis, Tokyo, Japan ; Conference date: 06-09-2010 Through 11-09-2010",

}

CMD 2010-International conference on condition monitoring and diagnosis. ed. / s.n. Tokyo, Japan : IEEE Society, 2010. p. 850-853.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Two level on-line monitoring system to reduce GIS components failure

AU - Al-Suhaily, MAG

AU - Meijer, S

AU - Smit, JJ

AU - Sibbald, P

AU - Kanters, J

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 850

EP - 853

BT - CMD 2010-International conference on condition monitoring and diagnosis

A2 - s.n., null

PB - IEEE Society

CY - Tokyo, Japan

T2 - 2010 Conference on Condition Monitoring and Diagnosis, Tokyo, Japan

Y2 - 6 September 2010 through 11 September 2010

ER -