Two Reliability Regimes for Cybersecurity and Their Implications for Government

MJG van Eeten, M Kars, HG van der Voort, R van der Luit, JA de Bruijn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationSeminar Infrastructure Reliability
EditorsHenk van Zuylen
Place of PublicationDelft
PublisherTransumo, TRS Programme, NGI Foundation
Pages1-24
Number of pages24
Publication statusPublished - 2006
EventSeminar Infrastructure Reliability - Delft
Duration: 22 Jun 2006 → …

Publication series

Name
PublisherTransumo, TRS Programme, NGI Foundation

Conference

ConferenceSeminar Infrastructure Reliability
Period22/06/06 → …

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

van Eeten, MJG., Kars, M., van der Voort, HG., van der Luit, R., & de Bruijn, JA. (2006). Two Reliability Regimes for Cybersecurity and Their Implications for Government. In H. van Zuylen (Ed.), Seminar Infrastructure Reliability (pp. 1-24). Transumo, TRS Programme, NGI Foundation.