UHF defect evaluation in gas insulated equipment

S Meijer; JJ Smit

doi:doi:10.1109/TDEI.2005.1430398

UHF defect evaluation in gas insulated equipment

S Meijer, JJ Smit

Research output: Contribution to journal › Article › Scientific › peer-review

56 Citations (Scopus)

Abstract

Small defects in SF/sub 6/ gas-insulated substations like fixed particles (fixed to conductors or on spacer surfaces) or free moving particles can influence the insulation strength of the insulation system. To determine the risk of such defects on the insulation strength, identification of the PD source is one of the most important steps. In this paper, a method to identify defects based on statistical analysis of frequency spectra is introduced. Finally two examples of risk analysis of defects in GIS are shown.

Original language	Undefined/Unknown
Pages (from-to)	285-296
Number of pages	12
Journal	IEEE Transactions on Dielectrics and Electrical Insulation
Volume	12
Issue number	2
DOIs	https://doi.org/doi:10.1109/TDEI.2005.1430398
Publication status	Published - 2005

Keywords

academic journal papers
ZX CWTS JFIS < 1.00

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doi:10.1109/TDEI.2005.1430398

Cite this

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title = "UHF defect evaluation in gas insulated equipment",

abstract = "Small defects in SF/sub 6/ gas-insulated substations like fixed particles (fixed to conductors or on spacer surfaces) or free moving particles can influence the insulation strength of the insulation system. To determine the risk of such defects on the insulation strength, identification of the PD source is one of the most important steps. In this paper, a method to identify defects based on statistical analysis of frequency spectra is introduced. Finally two examples of risk analysis of defects in GIS are shown.",

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AB - Small defects in SF/sub 6/ gas-insulated substations like fixed particles (fixed to conductors or on spacer surfaces) or free moving particles can influence the insulation strength of the insulation system. To determine the risk of such defects on the insulation strength, identification of the PD source is one of the most important steps. In this paper, a method to identify defects based on statistical analysis of frequency spectra is introduced. Finally two examples of risk analysis of defects in GIS are shown.

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DO - doi:10.1109/TDEI.2005.1430398

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