Ultrashallow junction silicon photodiodes for detection of low energy electrons

A Sakic, LK Nanver, TLM Scholtes, CTH Heerkens, G van Veen, K Kooijman, P. Vogelsang

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010
Editors	P French et al
Place of Publication	Utrecht, The Netherlands
Publisher	STW
Pages	150-153
Number of pages	4
Publication status	Published - 2010
Event	13th SAFE Workshop STW.ICT Conference 2010 - Utrecht, The Netherlands Duration: 18 Nov 2010 → 19 Nov 2010

Name
Publisher	STW

Conference	13th SAFE Workshop STW.ICT Conference 2010
Period	18/11/10 → 19/11/10

Keywords

@inproceedings{2921f4b7bce446e299e5932018603d1b,

title = "Ultrashallow junction silicon photodiodes for detection of low energy electrons",

keywords = "Conf.proc. > 3 pag",

author = "A Sakic and LK Nanver and TLM Scholtes and CTH Heerkens and {van Veen}, G and K Kooijman and P. Vogelsang",

year = "2010",

language = "English",

publisher = "STW",

pages = "150--153",

editor = "{French et al}, P",

booktitle = "Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010",

note = "13th SAFE Workshop STW.ICT Conference 2010 ; Conference date: 18-11-2010 Through 19-11-2010",

}

Ultrashallow junction silicon photodiodes for detection of low energy electrons. / Sakic, A; Nanver, LK; Scholtes, TLM et al.
Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010. ed. / P French et al. Utrecht, The Netherlands: STW, 2010. p. 150-153.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Ultrashallow junction silicon photodiodes for detection of low energy electrons

AU - Sakic, A

AU - Nanver, LK

AU - Scholtes, TLM

AU - Heerkens, CTH

AU - van Veen, G

AU - Kooijman, K

AU - Vogelsang, P.

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 150

EP - 153

BT - Proceedings 13th SAFE Workshop of the STW.ICT Conference 2010

A2 - French et al, P

PB - STW

CY - Utrecht, The Netherlands

T2 - 13th SAFE Workshop STW.ICT Conference 2010

Y2 - 18 November 2010 through 19 November 2010

ER -