Universal Behavior of the Resistance Noise Across the Metal-Insulator Transition in Silicon Inversion Layers

J Jaroszynski, D Popovic, TM Klapwijk

    Research output: Contribution to journalArticleScientificpeer-review

    87 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)276401-1-276401-4
    JournalPhysical Review Letters
    Volume89
    Issue number27
    Publication statusPublished - 2002

    Bibliographical note

    Klapwijk

    Keywords

    • academic journal papers
    • ZX CWTS 1.00 <= JFIS < 3.00

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