Unraveling the hydrogen sulfide aging mechanism on electrical-thermal–mechanical property degradation of sintered nanocopper interconnects used in power electronics packaging

Wei Chen, Xu Liu, Dong Hu, Xu Liu, Xi Zhu, Xuejun Fan, Guoqi Zhang, Jiajie Fan*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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Engineering

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Material Science