Untestable faults identification in GPGPUs for safety-critical applications

Josie E.Rodriguez Condia; Felipe A. Da Silva; S. Hamdioui; C. Sauer; M. Sonza Reorda

doi:10.1109/ICECS46596.2019.8964677

Untestable faults identification in GPGPUs for safety-critical applications

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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Abstract

Nowadays, General Purpose Graphics Processing Units (GPGPUs) devices are considered as promising solutions for high-performance safety-critical applications, such as those in the automotive field. However, their adoption requires solutions to effectively detect faults arising in the device during the operative life. Hence, effective in-field test solutions are required to guarantee high-reliability levels. In this paper, we leverage the results of Software-Based Self-Test (SBST) based approaches for GPGPUs by deploying new techniques for automating the identification of untestable faults (UF). Our methodology has achieved fault coverage of 82.8% when applied to an open-source implementation of the NVIDIA G80 GPU architecture. The proposed approach combining SBSTs and UFs identification appears as an effective solution for the reliability analysis of GPGPUs.

Original language	English
Title of host publication	2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	570-573
Number of pages	4
ISBN (Electronic)	9781728109961
DOIs	https://doi.org/10.1109/ICECS46596.2019.8964677
Publication status	Published - 2019
Event	26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 - Genoa, Italy Duration: 27 Nov 2019 → 29 Nov 2019

Conference

Conference	26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
Country	Italy
City	Genoa
Period	27/11/19 → 29/11/19

Keywords

GPGPUs
SBST
Testing
Untestable faults

Access to Document

10.1109/ICECS46596.2019.8964677

PID6183725-finalAccepted author manuscript, 897 KB

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Condia, J. E. R., Da Silva, F. A., Hamdioui, S., Sauer, C., & Reorda, M. S. (2019). Untestable faults identification in GPGPUs for safety-critical applications. In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 (pp. 570-573). [8964677] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICECS46596.2019.8964677

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Condia, JER, Da Silva, FA , Hamdioui, S, Sauer, C & Reorda, MS 2019, Untestable faults identification in GPGPUs for safety-critical applications. in 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019., 8964677, Institute of Electrical and Electronics Engineers (IEEE), pp. 570-573, 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, 27/11/19. https://doi.org/10.1109/ICECS46596.2019.8964677

Untestable faults identification in GPGPUs for safety-critical applications. / Condia, Josie E.Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza.

2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019. Institute of Electrical and Electronics Engineers (IEEE), 2019. p. 570-573 8964677.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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