Abstract
Nowadays, General Purpose Graphics Processing Units (GPGPUs) devices are considered as promising solutions for high-performance safety-critical applications, such as those in the automotive field. However, their adoption requires solutions to effectively detect faults arising in the device during the operative life. Hence, effective in-field test solutions are required to guarantee high-reliability levels. In this paper, we leverage the results of Software-Based Self-Test (SBST) based approaches for GPGPUs by deploying new techniques for automating the identification of untestable faults (UF). Our methodology has achieved fault coverage of 82.8% when applied to an open-source implementation of the NVIDIA G80 GPU architecture. The proposed approach combining SBSTs and UFs identification appears as an effective solution for the reliability analysis of GPGPUs.
Original language | English |
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Title of host publication | 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 570-573 |
Number of pages | 4 |
ISBN (Electronic) | 9781728109961 |
DOIs | |
Publication status | Published - 2019 |
Event | 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 - Genoa, Italy Duration: 27 Nov 2019 → 29 Nov 2019 |
Conference
Conference | 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 |
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Country | Italy |
City | Genoa |
Period | 27/11/19 → 29/11/19 |
Keywords
- GPGPUs
- SBST
- Testing
- Untestable faults