@inproceedings{6f12ef708a1b4b2aabf5e0b142b60b6a,
title = "Untestable faults identification in GPGPUs for safety-critical applications",
abstract = "Nowadays, General Purpose Graphics Processing Units (GPGPUs) devices are considered as promising solutions for high-performance safety-critical applications, such as those in the automotive field. However, their adoption requires solutions to effectively detect faults arising in the device during the operative life. Hence, effective in-field test solutions are required to guarantee high-reliability levels. In this paper, we leverage the results of Software-Based Self-Test (SBST) based approaches for GPGPUs by deploying new techniques for automating the identification of untestable faults (UF). Our methodology has achieved fault coverage of 82.8% when applied to an open-source implementation of the NVIDIA G80 GPU architecture. The proposed approach combining SBSTs and UFs identification appears as an effective solution for the reliability analysis of GPGPUs.",
keywords = "GPGPUs, SBST, Testing, Untestable faults",
author = "Condia, {Josie E.Rodriguez} and {Da Silva}, {Felipe A.} and S. Hamdioui and C. Sauer and Reorda, {M. Sonza}",
year = "2019",
doi = "10.1109/ICECS46596.2019.8964677",
language = "English",
series = "2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",
pages = "570--573",
booktitle = "2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019",
address = "United States",
note = "26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 ; Conference date: 27-11-2019 Through 29-11-2019",
}