Untestable faults identification in GPGPUs for safety-critical applications

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda

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Abstract

Nowadays, General Purpose Graphics Processing Units (GPGPUs) devices are considered as promising solutions for high-performance safety-critical applications, such as those in the automotive field. However, their adoption requires solutions to effectively detect faults arising in the device during the operative life. Hence, effective in-field test solutions are required to guarantee high-reliability levels. In this paper, we leverage the results of Software-Based Self-Test (SBST) based approaches for GPGPUs by deploying new techniques for automating the identification of untestable faults (UF). Our methodology has achieved fault coverage of 82.8% when applied to an open-source implementation of the NVIDIA G80 GPU architecture. The proposed approach combining SBSTs and UFs identification appears as an effective solution for the reliability analysis of GPGPUs.

Original languageEnglish
Title of host publication2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages570-573
Number of pages4
ISBN (Electronic)9781728109961
DOIs
Publication statusPublished - 2019
Event26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 - Genoa, Italy
Duration: 27 Nov 201929 Nov 2019

Conference

Conference26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019
CountryItaly
CityGenoa
Period27/11/1929/11/19

Keywords

  • GPGPUs
  • SBST
  • Testing
  • Untestable faults

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  • Cite this

    Condia, J. E. R., Da Silva, F. A., Hamdioui, S., Sauer, C., & Reorda, M. S. (2019). Untestable faults identification in GPGPUs for safety-critical applications. In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 (pp. 570-573). [8964677] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ICECS46596.2019.8964677