TY - JOUR
T1 - Using Landau quantization to probe disorder in semiconductor heterostructures
AU - Elsayed, Asser
AU - Costa, Davide
AU - Stehouwer, Lucas E.A.
AU - Tosato, Alberto
AU - Lodari, Mario
AU - Paquelet Wuetz, Brian
AU - Degli Esposti, Davide
AU - Scappucci, Giordano
N1 - Publisher Copyright:
© 2026 Author(s).
PY - 2026/1/19
Y1 - 2026/1/19
N2 - Understanding scattering mechanisms in semiconductor heterostructures is crucial to reducing sources of disorder and ensuring high yield and uniformity in large spin qubit arrays. Disorder of the parent two-dimensional electron or hole gas is commonly estimated by the critical, percolation-driven density associated with the metal–insulator transition. However, a reliable estimation of the critical density within percolation theory is hindered by the need to measure conductivity with high precision at low carrier densities, where experiments are most difficult. Here, we connect experimentally percolation density and quantum Hall plateau width, in line with an earlier heuristic intuition, and offer an alternative method for characterizing semiconductor heterostructure disorder.
AB - Understanding scattering mechanisms in semiconductor heterostructures is crucial to reducing sources of disorder and ensuring high yield and uniformity in large spin qubit arrays. Disorder of the parent two-dimensional electron or hole gas is commonly estimated by the critical, percolation-driven density associated with the metal–insulator transition. However, a reliable estimation of the critical density within percolation theory is hindered by the need to measure conductivity with high precision at low carrier densities, where experiments are most difficult. Here, we connect experimentally percolation density and quantum Hall plateau width, in line with an earlier heuristic intuition, and offer an alternative method for characterizing semiconductor heterostructure disorder.
UR - http://www.scopus.com/inward/record.url?scp=105028161286&partnerID=8YFLogxK
U2 - 10.1063/5.0305352
DO - 10.1063/5.0305352
M3 - Article
AN - SCOPUS:105028161286
SN - 0003-6951
VL - 128
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 3
M1 - 032101
ER -