Using line segments as structuring elements for sampling-invariant measurements

CL Luengo Hendriks, LJ van Vliet

    Research output: Contribution to journalArticleScientificpeer-review

    10 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1826-1831
    Number of pages6
    JournalIEEE Transactions on Pattern Analysis and Machine Intelligence
    Volume27
    Issue number11
    Publication statusPublished - 2005

    Keywords

    • ZX CWTS 1.00 <= JFIS < 3.00

    Cite this