Using line segments as structuring elements for sampling-invariant measurements

CL Luengo Hendriks, LJ van Vliet

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1826-1831
Number of pages	6
Journal	IEEE Transactions on Pattern Analysis and Machine Intelligence
Volume	27
Issue number	11
Publication status	Published - 2005

Keywords

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T1 - Using line segments as structuring elements for sampling-invariant measurements

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AU - van Vliet, LJ

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JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

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