Using linear tests for transient faults in DRAMs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationInternational Design and Test workshop
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages-
Publication statusPublished - 2006
EventIDT2006 - Piscataway
Duration: 17 Nov 200622 Nov 2006

Publication series

Name
PublisherIEEE

Conference

ConferenceIDT2006
Period17/11/0622/11/06

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag

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