Using Reverse-Engineered Test-Based Models to Generate More Tests: Where is the Sense in That?

TS Kanstren, EAB Piel, HG Gross

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	9th International Conference on Information Technology: New Generation
Editors	sn
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	247-252
Number of pages	6
ISBN (Print)	978-1-4673-0798-7
Publication status	Published - 2012
Event	9th International Conference on Information Technology: New Generation - Los Alamitos Duration: 16 Apr 2012 → 18 Apr 2012

Name
Publisher	IEEE

Conference	9th International Conference on Information Technology: New Generation
Period	16/04/12 → 18/04/12

Keywords

@inproceedings{786e4cc6d6684f8abeca6f7b86343df9,

title = "Using Reverse-Engineered Test-Based Models to Generate More Tests: Where is the Sense in That?",

keywords = "Conf.proc. > 3 pag",

author = "TS Kanstren and EAB Piel and HG Gross",

year = "2012",

language = "English",

isbn = "978-1-4673-0798-7",

publisher = "IEEE",

pages = "247--252",

editor = "sn",

booktitle = "9th International Conference on Information Technology: New Generation",

address = "United States",

note = "9th International Conference on Information Technology: New Generation ; Conference date: 16-04-2012 Through 18-04-2012",

}

Using Reverse-Engineered Test-Based Models to Generate More Tests: Where is the Sense in That? / Kanstren, TS; Piel, EAB; Gross, HG.
9th International Conference on Information Technology: New Generation. ed. / sn. Los Alamitos: IEEE, 2012. p. 247-252.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review