Using RRNS codes for cluster faults tolerance in hybrid memories

NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publication2009 IEEE international symposium on defect and fault tolerance in VLSI systems
EditorsD Gizopoulos, M Tehranipoor, S Tragoudas
Place of PublicationPiscataway
PublisherIEEE Society
Pages85-93
Number of pages9
ISBN (Print)978-0-7695-3839-6
Publication statusPublished - 2009
EventDFT 2009 - Piscataway
Duration: 7 Oct 20099 Oct 2009

Publication series

Name
PublisherIEEE

Conference

ConferenceDFT 2009
Period7/10/099/10/09

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this

Haron, NZB., & Hamdioui, S. (2009). Using RRNS codes for cluster faults tolerance in hybrid memories. In D. Gizopoulos, M. Tehranipoor, & S. Tragoudas (Eds.), 2009 IEEE international symposium on defect and fault tolerance in VLSI systems (pp. 85-93). IEEE Society.