Using the CFP-methodology for PP and PS angle dependent reflectivity analysis

AJ Berkhout, PLA Winthaegen, DJ Verschuur

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationExtended abstracts of the 72nd annual SEG meeting
    PublisherSociety of Exploration Geophysicists
    Pages265-268
    Number of pages4
    Publication statusPublished - 2002

    Publication series

    Name
    PublisherSociety of Exploration Geophysicists

    Keywords

    • ZX CWTS JFIS < 1.00

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