Using the CFP-methodology for PP and PS angle dependent reflectivity analysis

AJ Berkhout, PLA Winthaegen, DJ Verschuur

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Extended abstracts of the 72nd annual SEG meeting
Publisher	Society of Exploration Geophysicists
Pages	265-268
Number of pages	4
Publication status	Published - 2002

Name
Publisher	Society of Exploration Geophysicists

Keywords

@inproceedings{838d845f0fa74d74a033fde08b995d52,

title = "Using the CFP-methodology for PP and PS angle dependent reflectivity analysis",

keywords = "ZX CWTS JFIS < 1.00",

author = "AJ Berkhout and PLA Winthaegen and DJ Verschuur",

year = "2002",

language = "Undefined/Unknown",

publisher = "Society of Exploration Geophysicists",

pages = "265--268",

booktitle = "Extended abstracts of the 72nd annual SEG meeting",

address = "United States",

}