Variance estimation for two-class and multi-class ROC analysis using operating point averaging

P Paclik, C Lai, J Novovicova, RPW Duin

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the 19th International Conference on Pattern Recognition
Editors s.n.
Place of PublicationNew York, USA
PublisherIEEE Society
Pages1-4
Number of pages4
ISBN (Print)978-1-4244-2175
Publication statusPublished - 2008
EventThe 19th International Conference on Pattern Recognition - New York, USA
Duration: 8 Dec 200811 Dec 2008

Publication series

Name
PublisherIEEE

Conference

ConferenceThe 19th International Conference on Pattern Recognition
Period8/12/0811/12/08

Keywords

  • Wiskunde en Informatica
  • Techniek
  • technische Wiskunde en Informatica
  • conference contrib. refereed
  • Conf.proc. > 3 pag

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